Atomic Force Microscopy
Atomic Force Microscopy (AFM) is a high-resolution imaging technique that uses a small probe to scan the surface of a sample. The probe is mounted on a cantilever and interacts with the sample surface, producing a topographic image of the surface features. AFM can provide information about the surface morphology, roughness, and mechanical properties of the sample. It can also be used to measure the forces between the probe and the sample surface, allowing for the study of intermolecular forces and surface interactions. AFM has applications in materials science, biology, and nanotechnology, and is particularly useful for studying samples that are difficult to image with other techniques, such as soft or fragile materials.
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