Scanning Electron Microscopes
Scanning Electron Microscopes (SEMs) are instruments that use a focused beam of electrons to image the surface of a sample. The electron beam scans the sample and interacts with the atoms in the material, producing various signals that can be detected and used to create an image. SEMs are capable of producing high-resolution images with magnifications up to 1,000,000x, making them a valuable tool for materials science, nanotechnology, and biology. In addition to imaging, SEMs can also be used for elemental analysis, crystallography, and other analytical techniques.
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